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    Defect prediction on production line

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    Publication date
    2022
    End of Embargo
    2023-11-18
    Author
    Khalfaoui, S.
    Manouvrier, E.
    Briot, A.
    Delaux, D.
    Butel, S.
    Ibrahim, Jesutofunmi
    Kanyere, Tatenda
    Orimogunje, Bola
    Abdullatif, Amr A.A.
    Neagu, Daniel
    Keyword
    Manufacturing
    Quality control
    Defect prediction
    Machine learning
    Supervised learning
    Rights
    © 2022 The Author(s), under exclusive license to Springer Nature Switzerland AG. Reproduced in accordance with the publisher's self-archiving policy. The final publication is available at Springer via https://doi.org/10.1007/978-3-030-87094-2_47.
    Peer-Reviewed
    Yes
    Open Access status
    embargoedAccess
    
    Metadata
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    Abstract
    Quality control has long been one of the most challenging fields of manufacturing. The development of advanced sensors and the easier collection of high amounts of data designate the machine learning techniques as a timely natural step forward to leverage quality decision support and manufacturing challenges. This paper introduces an original dataset provided by the automotive supplier company VALEO, coming from a production line, and hosted by the École Normale Supérieure (ENS) Data Challenge to predict defects using non-anonymised features, without access to final test results, to validate the part status (defective or not). We propose in this paper a complete workflow from data exploration to the modelling phase while addressing at each stage challenges and techniques to solve them, as a benchmark reference. The proposed workflow is validated in series of experiments that demonstrate the benefits, challenges and impact of data science adoption in manufacturing.
    URI
    http://hdl.handle.net/10454/19037
    Version
    Accepted manuscript
    Citation
    Khalfaoui S, Manouvrier E, Briot A et al (2022) Defect prediction on production line. In: Jansen T, Jensen R, Mac Parthalain N et al (Eds.) Advances in Computational Intelligence Systems. UKCI 2021. Advances in Intelligent Systems and Computing. 1409. Springer, Cham.
    Link to publisher’s version
    https://doi.org/10.1007/978-3-030-87094-2_47
    Type
    Book chapter
    Notes
    The full-text of this book chapter will be released for public view at the end of the publisher embargo on 18 Nov 2023.
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    Engineering and Informatics Publications

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