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dc.contributor.authorWan, Q*
dc.contributor.authorPlenderleith, R.A.*
dc.contributor.authorDapor, M.*
dc.contributor.authorRimmer, Stephen*
dc.contributor.authorClaeyssens, F.*
dc.contributor.authorRodenburg, C.*
dc.date.accessioned2017-02-15T14:54:21Z
dc.date.available2017-02-15T14:54:21Z
dc.date.issued2015
dc.identifier.citationWan Q, Plenderleith RA, Dapor M et al (2015) Separating topographical and chemical analysis of nanostructure of polymer composite in low voltage SEM. Journal of Physics: Conference Series. 644. Conference 1.en_US
dc.identifier.urihttp://hdl.handle.net/10454/11367
dc.descriptionYesen_US
dc.description.abstractThe possibility of separating the topographical and chemical information in a polymer nano-composite using low-voltage SEM imaging is demonstrated, when images are acquired with a Concentric Backscattered (CBS) detector. This separation of chemical and topographical information is based on the different angular distribution of electron scattering which were calculated using a Monte Carlo simulation. The simulation based on angular restricted detection was applied to a semi-branched PNIPAM/PEGDA interpenetration network for which a linear relationship of topography SEM contrast and feature height data was observed.en_US
dc.description.sponsorshipEPSRCen_US
dc.language.isoenen_US
dc.relation.isreferencedbyhttp://stacks.iop.org/1742-6596/644/i=1/a=012018en_US
dc.rights© 2015 The Authors. This Open Access article is distributed under the Creative Commons CC-BY license (http://creativecommons.org/licenses/by/3.0)en_US
dc.subjectHydrogels; Topographyen_US
dc.titleSeparating topographical and chemical analysis of nanostructure of polymer composite in low voltage SEMen_US
dc.status.refereedYesen_US
dc.typeArticleen_US
dc.type.versionPublished versionen_US
refterms.dateFOA2018-07-26T09:23:38Z


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