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Separating topographical and chemical analysis of nanostructure of polymer composite in low voltage SEM
Wan, Q Plenderleith, R.A. Dapor, M. Rimmer, Stephen Claeyssens, F. Rodenburg, C.
Wan, Q
Plenderleith, R.A.
Dapor, M.
Rimmer, Stephen
Claeyssens, F.
Rodenburg, C.
Publication Date
2015
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© 2015 The Authors. This Open Access article is distributed under the Creative Commons CC-BY license (http://creativecommons.org/licenses/by/3.0)
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Abstract
The possibility of separating the topographical and chemical information in a polymer nano-composite using low-voltage SEM imaging is demonstrated, when images are acquired with a Concentric Backscattered (CBS) detector. This separation of chemical and topographical information is based on the different angular distribution of electron scattering which were calculated using a Monte Carlo simulation. The simulation based on angular restricted detection was applied to a semi-branched PNIPAM/PEGDA interpenetration network for which a linear relationship of topography SEM contrast and feature height data was observed.
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Wan Q, Plenderleith RA, Dapor M et al (2015) Separating topographical and chemical analysis of nanostructure of polymer composite in low voltage SEM. Journal of Physics: Conference Series. 644. Conference 1.
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