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Weakest Bus Identification Based on Modal Analysis and Singular Value Decomposition Techniques

Jalboub, Mohamed K.
Rajamani, Haile S.
Ihbal, Abdel-Baset M.I.
Publication Date
02/12/2010
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© 2010 IEEE. Reprinted, with permission: Jalboub, M. K., Rajamani, H. S., Abd-Alhameed, R. A. and Ihbal, A. M. (2010). Weakest Bus Identification Based on Modal Analysis and Singular Value Decomposition Techniques. In: 1st International Conference on Energy, Power and Control (EPC-IQ01), 30 Nov to 02 Dec 2010, Basrah, Iraq. IEEE. pp. 352- 357. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Bradford¿s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
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Abstract
Voltage instability problems in power system is an important issue that should be taken into consideration during the planning and operation stages of modern power system networks. The system operators always need to know when and where the voltage stability problem can occur in order to apply suitable action to avoid unexpected results. In this paper, a study has been conducted to identify the weakest bus in the power system based on multi-variable control, modal analysis, and Singular Value Decomposition (SVD) techniques for both static and dynamic voltage stability analysis. A typical IEEE 3-machine, 9-bus test power system is used to validate these techniques, for which the test results are presented and discussed.
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Jalboub MK, Rajamani HS, Abd-Alhameed R et al (2010) Weakest Bus Identification Based on Modal Analysis and Singular Value Decomposition Techniques. In: 1st International Conference on Energy, Power and Control (EPC-IQ01), 30 Nov to 02 Dec 2010, Basrah, Iraq. IEEE. pp. 352- 357.
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